Xueshi Li,Shunfa Liu,Yuming Wei,Jiantao Ma,Changkun Song,Ying Yu,Rongbin Su,Wei Geng,Haiqiao Ni,Hanqing Liu,Xiangbin Su,Zhichuan Niu,You-Ling Chen,Jin Liu
Xueshi Li
State Key Laboratory of Optoelectronic Materials and Technologies, School of Physics, School of Electronics and Information Technology, Sun Yat-sen University, 510275, Guangzhou, China.
Shunfa Liu
State Key Laboratory of Optoelectronic Materials and Technologies, School of Physics, School of Electronics and Information Technology, Sun Yat-sen University, 510275, Guangzhou, China.
Yuming Wei
State Key Laboratory of Optoelectronic Materials and Technologies, School of Physics, School of Electronics and Information Technology, Sun Yat-sen University, 510275, Guangzhou, China.
Jiantao Ma
State Key Laboratory of Optoelectronic Materials and Technologies, School of Physics, School of Electronics and Information Technology, Sun Yat-sen University, 510275, Guangzhou, China.
Changkun Song
State Key Laboratory of Optoelectronic Materials and Technologies, School of Physics, School of Electronics and Information Technology, Sun Yat-sen University, 510275, Guangzhou, China.
Ying Yu
State Key Laboratory of Optoelectronic Materials and Technologies, School of Physics, School of Electronics and Information Technology, Sun Yat-sen University, 510275, Guangzhou, China.
Rongbin Su
State Key Laboratory of Optoelectronic Materials and Technologies, School of Physics, School of Electronics and Information Technology, Sun Yat-sen University, 510275, Guangzhou, China.
Wei Geng
Hisilicon Research, Huawei Technologies Co., Ltd, 518129, Shenzhen, China.
Haiqiao Ni
State Key Laboratory for Superlattice and Microstructures, State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, 100083, Beijing, China.
Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, 100049, Beijing, China.
Hanqing Liu
State Key Laboratory for Superlattice and Microstructures, State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, 100083, Beijing, China.
Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, 100049, Beijing, China.
Xiangbin Su
State Key Laboratory for Superlattice and Microstructures, State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, 100083, Beijing, China.
Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, 100049, Beijing, China.
Zhichuan Niu
State Key Laboratory for Superlattice and Microstructures, State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, 100083, Beijing, China. zcniu@semi.ac.cn.
Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, 100049, Beijing, China. zcniu@semi.ac.cn.
You-Ling Chen
State Key Laboratory for Superlattice and Microstructures, State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, 100083, Beijing, China. ylchen@semi.ac.cn.
Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, 100049, Beijing, China. ylchen@semi.ac.cn.
Jin Liu
State Key Laboratory of Optoelectronic Materials and Technologies, School of Physics, School of Electronics and Information Technology, Sun Yat-sen University, 510275, Guangzhou, China. liujin23@mail.sysu.edu.cn.
